Testing process capability based onCpmin the presence of random measurement errors

DOI10.1080/02664760500164951zbMath1121.62468MaRDI QIDQ3592053

Bi-Min Hsu, Ming-Hung Shu, Wen Lea Pearn

Publication date: 11 September 2007

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664760500164951

zbMATH Keywords

critical value; process capability analysis; lower confidence bound; gauge measurement error

Mathematics Subject Classification ID

62-XX: Statistics

Related Items

Performance comparison of generalized confidence interval and modified sampling distribution approaches for assessing one-sided capability indices with gauge measurement errors, Inference on C _pk for autocorrelated data in the presence of random measurement errors, Multivariate process capability using principal component analysis in the presence of measurement errors, Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors, Process performance evaluation based on Taguchi capability index with the consideration of measurement errors, Using a novel approach to assess process performance in the presence of measurement errors

Cites Work

• On the distributions of the estimated process capability indices
• Distributional and inferential properties of the process accuracy and process precision indices
• Lower confidence bounds with sample size information for C_pm applied to production yield assurance
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