Testing process capability based onCpmin the presence of random measurement errors

DOI10.1080/02664760500164951MaRDI QIDQ3592053zbMATH OpenOpenAlexFDO

Authors Wen Lea Pearn, Ming-Hung Shu, Bi-Min Hsu

Publication date 11 September 2007

Published in Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/02664760500164951

zbMATH Keywords

critical valuegauge measurement errorlower confidence boundprocess capability analysis

Mathematics Subject Classification ID

Statistics (62-XX)

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Cites work

• Distributional and inferential properties of the process accuracy and process precision indices
• scientific article; zbMATH DE number 952740 (Why is no real title available?)
• scientific article; zbMATH DE number 3338262 (Why is no real title available?)
• Lower confidence bounds with sample size information for C_pm applied to production yield assurance
• On the distributions of the estimated process capability indices

Cited in

(11)

• Multivariate process capability using principal component analysis in the presence of measurement errors
• Impact of measurement errors on the performance and distributional properties of the multivariate capability index \(\mathrm{NMC }_{\mathrm{pm}}\)
• Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors
• Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
• Using a novel approach to assess process performance in the presence of measurement errors
• Misclassification rates, critical values and size of the design in measurement systems capability studies
• Gage capability control for electronic measurement instruments with time-dependent degene\-ration
• Measurement instruments control with both accuracy and precision considerations
• Performance comparison of generalized confidence interval and modified sampling distribution approaches for assessing one-sided capability indices with gauge measurement errors
• Inference on \(C_{\mathrm{pk}}\) for autocorrelated data in the presence of random measurement errors
• Statistical analysis of process capability indices with measurement errors: The case of C_p

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