Lower confidence bounds with sample size information for Cpm applied to production yield assurance
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Publication:4474692
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- Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
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- scientific article; zbMATH DE number 1218903
- Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances
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Cites work
Cited in
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- Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances
- Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
- Design and construction of a variables repetitive group sampling plan for unilateral specification limit
- On the Asymptotic Confidence Intervals of Multiple-Stream Yield Index
- Supplier evaluation and selection based on stochastic dominance: a quality-based approach
- Lower confidence bounds as precision measure for truncated processes
- Procedure of the convolution method for estimating production yield with sample size information
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- An improved approach for estimating product performance based on the capability index \(C_{pmk}\)
- Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
- Quality-yield measure for production processes with very low fraction defective
- An effective powerful test for one-sided supplier selection problem
- An asymptotic confidence interval for the process capability index Cpm
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- A powerful test for two-sided multiple independent characteristics supplier selection problem
- A flexible sampling scheme for variables inspection with loss consideration
- Evaluating lifetime performance for the Pareto model with censored and imprecise information
- Approximate confidence bounds for the process capability index \(C_{pm}\) based on subsamples
- Sample size determination for the estimate of process capability indices
- Tool replacement for production with a low fraction of defectives
- Multiple dependent state repetitive group sampling plan based on the Taguchi process capability index
- A switcher skip lot-sampling plan under resubmitted lots using the Taguchi capability index for building a solid vendor-customer relationship
- Optimal designing of skip-lot reinspection scheme based on the Taguchi process capability index
- Generalized confidence intervals for the process capability index \(C_{pm}\)
- Optimal tool replacement for processes with low fraction defective
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