Lower confidence bounds with sample size information for Cpm applied to production yield assurance
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Publication:4474692
DOI10.1080/0020754031000138349zbMATH Open1052.90542OpenAlexW2126004339MaRDI QIDQ4474692FDOQ4474692
Authors: Wen Lea Pearn, Ming-Hung Shu
Publication date: 12 July 2004
Published in: International Journal of Production Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/0020754031000138349
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Cites Work
Cited In (27)
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- Assessing process capability based on Bayesian approach with subsamples
- A flexible sampling scheme for variables inspection with loss consideration
- Tool replacement for production with a low fraction of defectives
- Evaluating lifetime performance for the Pareto model with censored and imprecise information
- Fuzzy inference to assess manufacturing process capability with imprecise data
- Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
- An asymptotic confidence interval for the process capability index Cpm
- Optimal tool replacement for processes with low fraction defective
- Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
- Generalized confidence intervals for the process capability index \(C_{pm}\)
- A powerful test for two-sided multiple independent characteristics supplier selection problem
- Testing process capability based onCpmin the presence of random measurement errors
- Design and construction of a variables repetitive group sampling plan for unilateral specification limit
- Lower confidence bounds as precision measure for truncated processes
- Procedure of the convolution method for estimating production yield with sample size information
- A Bayesian procedure for assessing process performance based on the third-generation capability index
- Sample size determination for production yield estimation with multiple independent process characteristics
- A comparison of methods for estimating loss-based capability index
- An improved approach for estimating product performance based on the capability index \(C_{pmk}\)
- Approximate confidence bounds for the process capability index \(C_{pm}\) based on subsamples
- An effective powerful test for one-sided supplier selection problem
- Sample size determination for the estimate of process capability indices
- Quality-yield measure for production processes with very low fraction defective
- Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances
- Supplier selection for one-sided processes with unequal sample sizes
- Supplier evaluation and selection based on stochastic dominance: a quality-based approach
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