Assessing process capability based on the lower confidence bound of C_pk for asymmetric tolerances
DOI10.1016/J.EJOR.2007.06.003zbMATH Open1140.62089OpenAlexW2074720695MaRDI QIDQ2482828FDOQ2482828
Authors: Yanyan Li 
Publication date: 24 April 2008
Published in: European Journal of Operational Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ejor.2007.06.003
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- scientific article; zbMATH DE number 2058071
Applications of statistics in engineering and industry; control charts (62P30) Software, source code, etc. for problems pertaining to statistics (62-04) Statistical tables (62Q05)
Cites Work
- SYSTEMS OF FREQUENCY CURVES GENERATED BY METHODS OF TRANSLATION
- An analysis of variance test for normality (complete samples)
- Distribution and moments in simplified form for a general class of capability indices
- Title not available (Why is that?)
- Brocess capability with asymmetric tolerances
- The \({C}_{pk}\) index for asymmetric tolerances: Implications and inference
- Distributional and Inferential Properties of the Process Loss Indices
- Some Process Capability Indices are More Reliable than One Might Think
- Title not available (Why is that?)
- On the asymptotic distributions of some process capability indices.
- Title not available (Why is that?)
- Quality-yield measure for production processes with very low fraction defective
- Tolerance design for products with asymmetric quality losses
- New generalization of process capability index Cpk
- On the Sampling Distributions of the Estimated Process Loss Indices with Asymmetric Tolerances
Cited In (11)
- A systematic look at the gamma process capability indices
- Lower confidence bounds with sample size information for Cpm applied to production yield assurance
- Process capability assessment for asymmetric tolerances with consideration of gauge measurement errors
- Developing a novel fuzzy testing model for capability index with asymmetric tolerances
- Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
- Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors
- Lower confidence bounds as precision measure for truncated processes
- A new approach to assess product lifetime performance for small data sets
- A product acceptance decision-making method based on process capability with considering gauge measurement errors
- Process Yield and Capability Indices
- Performance comparison of generalized confidence interval and modified sampling distribution approaches for assessing one-sided capability indices with gauge measurement errors
Uses Software
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