Distribution and moments in simplified form for a general class of capability indices
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Publication:4337308
DOI10.1080/03610929708831908zbMath0900.62552OpenAlexW1994361555MaRDI QIDQ4337308
Publication date: 12 November 1998
Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610929708831908
Applications of statistics in engineering and industry; control charts (62P30) Exact distribution theory in statistics (62E15)
Related Items (28)
The Asymptotic Distributions of Unified Process Capability Indices ⋮ A modified variables repetitive group sampling plan with the consideration of preceding lots information ⋮ Procedure of the convolution method for estimating production yield with sample size information ⋮ A general class of capability indices in the case of asymmetric tolerances ⋮ Assessing process capability based on Bayesian approach with subsamples ⋮ A variables sampling plan based on \(C_{\text{pmk}}\) for product acceptance determination ⋮ An efficient inspection scheme for variables based on Taguchi capability index ⋮ Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\) ⋮ A Bayesian procedure for assessing process performance based on the third-generation capability index ⋮ Elliptical safety region plots forCpk ⋮ Developing a variables two-plan sampling system for product acceptance determination ⋮ Using a novel approach to assess process performance in the presence of measurement errors ⋮ Decision-making in testing process performance with fuzzy data ⋮ A note on decision making method for product acceptance based on process capability indices \(C_{\mathrm {pk}}\) and \(C_{\mathrm{pmk}}\) ⋮ Families of Capability Indices for One-Sided Specification Limits ⋮ Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances ⋮ Estimating Process Capability IndexCPMUsing a Bootstrap Sequential Sampling Procedure ⋮ Quality-yield measure for production processes with very low fraction defective ⋮ Generalized Confidence Intervals for Comparing the Capability of Two Processes ⋮ An alternative approach to test process capability for unilateral specification with subsamples ⋮ Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives ⋮ Capability-based quick switching sampling system for lot disposition ⋮ Process Capability Assessment for Asymmetric Tolerances with Consideration of Gauge Measurement Errors ⋮ Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors ⋮ Estimating process capability indexCpk: classical approach versus Bayesian approach ⋮ A flexible sampling scheme for variables inspection with loss consideration ⋮ OnCpkAssessment in the Presence of Tool Wear ⋮ Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
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