Distribution and moments in simplified form for a general class of capability indices
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(34)- A note on decision making method for product acceptance based on process capability indices \(C_{\mathrm {pk}}\) and \(C_{\mathrm{pmk}}\)
- An efficient inspection scheme for variables based on Taguchi capability index
- Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives
- Capability-based quick switching sampling system for lot disposition
- Assessing process capability based on Bayesian approach with subsamples
- A variables sampling plan based on \(C_{\text{pmk}}\) for product acceptance determination
- Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances
- A modified variables repetitive group sampling plan with the consideration of preceding lots information
- Generalized confidence intervals for comparing the capability of two processes
- Process capability assessment for asymmetric tolerances with consideration of gauge measurement errors
- Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors
- On \(C_{pk}\) assessment in the presence of tool wear
- Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
- Developing a variables two-plan sampling system for product acceptance determination
- Using a novel approach to assess process performance in the presence of measurement errors
- The Asymptotic Distributions of Unified Process Capability Indices
- Procedure of the convolution method for estimating production yield with sample size information
- Estimating process capability index \(C_{PM}\) using a bootstrap sequential sampling procedure
- A general class of capability indices in the case of asymmetric tolerances
- Families of Capability Indices for One-Sided Specification Limits
- Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
- Quality-yield measure for production processes with very low fraction defective
- scientific article; zbMATH DE number 788281 (Why is no real title available?)
- scientific article; zbMATH DE number 846105 (Why is no real title available?)
- A Bayesian procedure for assessing process performance based on the third-generation capability index
- Elliptical safety region plots forCpk
- Estimating process capability index \(c_{pk}\): classical approach versus Bayesian approach
- A flexible sampling scheme for variables inspection with loss consideration
- An alternative approach to test process capability for unilateral specification with subsamples
- A cost-effective sampling strategy by variables inspection for lot disposition
- Multiple dependent state repetitive group sampling plan based on the Taguchi process capability index
- A switcher skip lot-sampling plan under resubmitted lots using the Taguchi capability index for building a solid vendor-customer relationship
- Optimal designing of skip-lot reinspection scheme based on the Taguchi process capability index
- Decision-making in testing process performance with fuzzy data
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