Variables sampling inspection scheme for resubmitted lots based on the process capability index C_pk
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Publication:439424
Recommendations
- Variable sampling inspection for resubmitted lots based on process capability index \(C_{pk}\) for normally distributed items
- A flexible sampling scheme for variables inspection with loss consideration
- Optimal designing of variables sampling plan for resubmitted lots
- Determination of multiple dependent state repetitive group sampling plan based on the process capability index
- Developing a variables repetitive group sampling plan based on process capability index \(C_{pk}\) with unknown mean and variance
Cites work
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- Design of progressively censored group sampling plans for Weibull distributions: an optimization problem
- Designing variables sampling plans with process loss consideration
- Distribution and moments in simplified form for a general class of capability indices
- scientific article; zbMATH DE number 1061800 (Why is no real title available?)
- scientific article; zbMATH DE number 3802709 (Why is no real title available?)
- Multiple dependent state sampling plans for lot acceptance based on measurement data
- Sampling inspection for resubmitted lots
- Sequential variable sampling plan for normal distribution
- Statistical quality control. A modern introduction
- Variables sampling plans with PPM fraction of defectives and process loss consideration
Cited in
(43)- Developing a sampling plan by variables inspection for controlling lot fraction of defectives
- A systematic look at the gamma process capability indices
- Economic lot sampling inspection from defect counts with minimum conditional value-at-risk
- A note on decision making method for product acceptance based on process capability indices \(C_{\mathrm {pk}}\) and \(C_{\mathrm{pmk}}\)
- A mixed repetitive sampling plan based on process capability index
- Minimizing the area of a Pareto confidence region
- An efficient inspection scheme for variables based on Taguchi capability index
- Optimal truncated repetitive lot inspection with defect rates
- Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives
- A sequential test and a sequential sampling plan based on the process capability index \(C_{pmk}\)
- Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design
- Optimal lot sentencing based on defective counts and prior acceptability
- An adjustable inspection scheme for lot sentencing based on one-sided capability indices
- Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks
- Controlling posterior producer and consumer risks in lot reinspection
- Variable-sampling plans based on lifetime-performance index under exponential distribution with censoring and its extensions
- A variables sampling plan based on \(C_{\text{pmk}}\) for product acceptance determination
- A modified variables repetitive group sampling plan with the consideration of preceding lots information
- Attribute-variable inspection policy for lots using resampling based on EWMA
- Design and construction of a variables repetitive group sampling plan for unilateral specification limit
- Developing a variables two-plan sampling system for product acceptance determination
- Optimum attributes component test plans for k-out-of-n:F Weibull systems using prior information
- Classical and Bayesian estimation of the indexCpmkand its confidence intervals for normally distributed quality characteristic
- Variable sampling inspection for resubmitted lots based on process capability index \(C_{pk}\) for normally distributed items
- Sampling inspection for resubmitted lots
- Determination of a new sampling system based on exponentially weighted moving average
- scientific article; zbMATH DE number 1403882 (Why is no real title available?)
- Combined attri-vari inspection policy for resubmitted lots based on the process capability index
- Parametric inference of the process capability index for exponentiated exponential distribution
- A new policy for designing acceptance sampling plan based on Bayesian inference in the presence of inspection errors
- An entropic structure in capability indices
- A variable sampling plan using generalized multiple dependent state based on a one-sided process capability index
- Repetitive group sampling plan based on the process capability index for the lot acceptance problem
- Exact expression for the expectation of estimatedCpkbased on control chart information and the corresponding process capability control charts
- Repetitive variable acceptance sampling plan for one-sided specification
- A flexible sampling scheme for variables inspection with loss consideration
- Optimal designing of variables sampling plan for resubmitted lots
- Integrated QSS-RS plans based on the process yield index for lot acceptance determination
- On designing sampling inspection plans by variables based on skew-normal distribution
- Optimal skip-lot sampling plan based on the yield index for auto-correlated data
- Optimal and economic design of variables resampling scheme based on double specification limits
- A switcher skip lot-sampling plan under resubmitted lots using the Taguchi capability index for building a solid vendor-customer relationship
- A new system of skip-lot sampling plans including resampling
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