Variables sampling plans with PPM fraction of defectives and process loss consideration
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Recommendations
- Designing variables sampling plans with process loss consideration
- Variable repetitive group sampling plans with process loss consideration
- Developing a sampling plan by variables inspection for controlling lot fraction of defectives
- A variables sampling plan based on \(C_{\text{pmk}}\) for product acceptance determination
- Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives
Cited in
(24)- Designing variables sampling plans with process loss consideration
- Designing a multiple state repetitive group sampling plan based on the coefficient of variation
- Multiple dependent state repetitive group sampling plan based on the Taguchi process capability index
- Variable sampling inspection for resubmitted lots based on process capability index \(C_{pk}\) for normally distributed items
- Multiple dependent state repetitive sampling plans based on one-sided process capability indices
- Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
- Repetitive variable acceptance sampling plan for one-sided specification
- A mixed repetitive sampling plan based on process capability index
- A flexible sampling scheme for variables inspection with loss consideration
- Decision-making in testing process performance with fuzzy data
- A new multiple dependent state sampling plan based on the process capability index
- MULTIPLE DEFERRED STATE SAMPLING INSPECTION PLAN FOR VARIABLES BASED ON ONE-SIDED PROCESS CAPABILITY INDEX
- A new policy for designing acceptance sampling plan based on Bayesian inference in the presence of inspection errors
- Design of progressively censored group sampling plans for Weibull distributions: an optimization problem
- Developing a sampling plan by variables inspection for controlling lot fraction of defectives
- An efficient inspection scheme for variables based on Taguchi capability index
- A sequential test and a sequential sampling plan based on the process capability index \(C_{pmk}\)
- A powerful test for two-sided multiple independent characteristics supplier selection problem
- Optimal designing of skip-lot reinspection scheme based on the Taguchi process capability index
- A comparison of methods for estimating loss-based capability index
- An improved sampling plan by variables inspection with consideration of process yield and quality loss
- An effective powerful test for one-sided supplier selection problem
- Supplier selection for one-sided processes with unequal sample sizes
- Designing variables sampling plans based on the yield index Spk
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