Designing variables sampling plans based on the yield index Spk
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Publication:5079055
Cites work
- A modified variables repetitive group sampling plan with the consideration of preceding lots information
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- ASN-minimax double sampling plans by variables for two-sided specification limits when the standard deviation is known
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- Repetitive group sampling procedure for variables inspection
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- Statistical quality control. A modern introduction
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- Variables sampling plans with PPM fraction of defectives and process loss consideration
Cited in
(5)- An optimal construction of yield-based EWMA repetitive multivariate sampling plan
- Integrated QSS-RS plans based on the process yield index for lot acceptance determination
- Developing process-yield-based acceptance sampling plans for AR(1) auto-correlated process
- Optimal skip-lot sampling plan based on the yield index for auto-correlated data
- An efficient partial sampling inspection for lot sentencing based on process yield
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