Developing variables sampling plans based on EWMA yield index
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Cites work
- A new lot inspection procedure based on exponentially weighted moving average
- A note on acceptance sampling for variables
- Acceptance sampling plans under progressive interval censoring with likelihood ratio
- An EWMA control chart for the exponential distribution using repetitive sampling plan
- An optimization model for designing acceptance sampling plan based on cumulative count of conforming run length using minimum angle method
- ASN-minimax double sampling plans by variables for two-sided specification limits when the standard deviation is known
- Brocess capability with asymmetric tolerances
- Chain sampling plan for variables inspection
- Design of acceptance sampling plan using a modified EWMA statistic
- Designing optimal double-sampling plan based on process capability index
- Designing variables sampling plans with process loss consideration
- Determining the production lot size with a heuristic inspection policy for controlling the quality of input materials and products
- Developing a sampling plan by variables inspection for controlling lot fraction of defectives
- Developing a variables repetitive group sampling plan based on process capability index \(C_{pk}\) with unknown mean and variance
- Exact calculation of the dodge-romig LTPD single sampling plans for inspection by variables
- scientific article; zbMATH DE number 1240604 (Why is no real title available?)
- Improved acceptance sampling plan based on EWMA statistic
- Multiple dependent state sampling plans for lot acceptance based on measurement data
- Repetitive group sampling procedure for variables inspection
- Statistical quality control. A modern introduction
- Two-stage variables acceptance sampling plans using process loss functions
Cited in
(6)- Developing a sampling plan by variables inspection for controlling lot fraction of defectives
- MIXED REPETITIVE SAMPLING PLAN USING EWMA
- Designing variables sampling plans based on the yield index Spk
- Acceptance sampling plan based on an exponentially weighted moving average statistic with the yield index for autocorrelation between polynomial profiles
- An optimal construction of yield-based EWMA repetitive multivariate sampling plan
- An efficient partial sampling inspection for lot sentencing based on process yield
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