An efficient partial sampling inspection for lot sentencing based on process yield
From MaRDI portal
Cites work
- scientific article; zbMATH DE number 780774 (Why is no real title available?)
- A Sampling Inspection Plan for Continuous Production
- A modified variables repetitive group sampling plan with the consideration of preceding lots information
- A new system of skip-lot sampling plans including resampling
- A variables-type multiple-dependent-state sampling plan based on the lifetime performance index under a Weibull distribution
- Acceptance sampling in quality control
- An efficient inspection scheme for variables based on Taguchi capability index
- Asymptotic theory of statistics and probability
- Brocess capability with asymmetric tolerances
- Design and Evaluation of a Repetitive Group Sampling Plan
- Design and construction of a variables repetitive group sampling plan for unilateral specification limit
- Designing of variables repetitive group sampling plan for consumer protection
- Designing variables sampling plans based on the yield index Spk
- Developing a sampling plan by variables inspection for controlling lot fraction of defectives
- Developing a variables repetitive group sampling plan based on process capability index \(C_{pk}\) with unknown mean and variance
- Developing variables sampling plans based on EWMA yield index
- Economic design of quick switching sampling system for resubmitted lots
- Encyclopedia and handbook of process capability indices. A comprehensive exposition of quality control measures.
- Group selection for processes with multiple quality characteristics
- Numerical Optimization
- Optimal design of a skip-lot sampling reinspection plan with a double sampling plan as a reference plan
- Optimal design of variable acceptance sampling plans for mixture distribution
- Optimal designing of skip-lot sampling plan of type SkSP-2 with group acceptance sampling plan as reference plan under Burr-type XII distribution
- Optimal designing of variables sampling plan for resubmitted lots
- Repetitive group sampling plan based on the process capability index for the lot acceptance problem
- Repetitive variable acceptance sampling plan for one-sided specification
- Sequential variable sampling plan for normal distribution
This page was built for publication: An efficient partial sampling inspection for lot sentencing based on process yield
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q6601576)
