Developing process-yield-based acceptance sampling plans for AR(1) auto-correlated process

DOI10.1080/03610918.2021.1958845MaRDI QIDQ6082989zbMATH OpenOpenAlexFDO

Authors

Publication date 7 December 2023

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610918.2021.1958845

zbMATH Keywords

first-order auto-regressive \((\mathrm{AR}(1))\)process yield indexquick switching sampling systemvariables sampling plan

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Time series, auto-correlation, regression, etc. in statistics (GARCH) (62M10) Applications of statistics in engineering and industry; control charts (62P30) Applications of mathematical programming (90C90)

Cites work

• A modified variables repetitive group sampling plan with the consideration of preceding lots information
• A new multiple dependent state sampling plan based on the process capability index
• An improved sampling plan by variables inspection with consideration of process yield and quality loss
• Brocess capability with asymmetric tolerances
• Capability-based quick switching sampling system for lot disposition
• Designing variables sampling plans based on the yield index S_pk
• Developing and designing of an efficient variables sampling system based on the process capability index
• Estimating process capability indexes for autocorrelated data
• Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics
• Repetitive group sampling procedure for variables inspection
• Sampling schemes by variables inspection for the first-order autoregressive model between linear profiles
• Statistical quality control. A modern introduction
• Zero acceptance number quick switching system for compliance sampling

Cited in

(3)

• Integrated QSS-RS plans based on the process yield index for lot acceptance determination
• A Bayesian approach with double group sampling plan to estimate quality regions for proportion of nonconforming products in industry based on beta prior
• Designing acceptance sampling plans for polynomial profiles using EWMA statistics based on process yield index

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