Capability-based quick switching sampling system for lot disposition
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Publication:2294820
DOI10.1016/J.APM.2017.07.050zbMath1480.62251OpenAlexW2739655693MaRDI QIDQ2294820
Mei-Hsu Shih, Shih-Wen Liu, Amy H. I. Lee, Chien-wei Wu
Publication date: 12 February 2020
Published in: Applied Mathematical Modelling (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.apm.2017.07.050
Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25)
Related Items (11)
Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design ⋮ Integrated QSS-RS plans based on the process yield index for lot acceptance determination ⋮ Developing process-yield-based acceptance sampling plans for AR(1) auto-correlated process ⋮ An improved sampling plan by variables inspection with consideration of process yield and quality loss ⋮ Design and construction of a quick-switching sampling system with a third-generation capability index ⋮ Optimal lot sentencing based on defective counts and prior acceptability ⋮ Optimal truncated repetitive lot inspection with defect rates ⋮ An adjustable inspection scheme for lot sentencing based on one-sided capability indices ⋮ Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives ⋮ A two-sided SPRT control chart for process dispersion ⋮ Optimal lot disposition from Poisson-Lindley count data
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