An improved sampling plan by variables inspection with consideration of process yield and quality loss

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Publication:5107463

DOI10.1080/00949655.2019.1619739OpenAlexW2945588215WikidataQ127864605 ScholiaQ127864605MaRDI QIDQ5107463

Chien-wei Wu, Zih-Huei Wang

Publication date: 27 April 2020

Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00949655.2019.1619739




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