Parametric inference of the process capability index for exponentiated exponential distribution

DOI10.1080/02664763.2021.1971632MaRDI QIDQ5056936zbMATH OpenOpenAlexWikidataFDO

Authors Mahendra Saha, Sanku Dey, Saralees Nadarajah

Publication date 8 December 2022

Published in Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/02664763.2021.1971632

zbMATH Keywords

bootstrap confidence intervalclassical methods of estimationexponentiated exponential distributiongeneralized Rayleigh distributionMonte Carlo simulationprocess capability index

Mathematics Subject Classification ID

Applications of statistics (62Pxx)

Cites work

• Bootstrap confidence intervals of \(C_{Npk}\) for inverse Rayleigh and log-logistic distributions
• Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) for Lindley and power Lindley distributions
• Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) using different methods of estimation
• Bootstrap confidence intervals of process capability indexS_pmkusing different methods of estimation
• Bootstrap methods for standard errors, confidence intervals, and other measures of statistical accuracy
• Capability indices for Birnbaum-Saunders processes applied to electronic and food industries
• Determination of multiple dependent state repetitive group sampling plan based on the process capability index
• Estimation of selected parameters
• Exponentiated Chen distribution: Properties and estimation
• Generalized exponential distributions
• Goodness-of-fit tests when parameters are estimated
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• scientific article; zbMATH DE number 1917645 (Why is no real title available?)
• Improved bootstrap confidence intervals for the process capability index \(C_{pk}\)
• Kumaraswamy distribution: different methods of estimation
• Statistical inference for the lifetime performance index of products with Pareto distribution on basis of general progressive type II censored sample
• Variable sampling inspection for resubmitted lots based on process capability index \(C_{pk}\) for normally distributed items
• Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
• Weighted exponential distribution: properties and different methods of estimation

Cited in

(3)

• Classical and Bayesian estimation of PCI \(\mathcal{C}_{\mathrm{pc}}\) using power generalized Weibull distribution
• A comparative study of six process capability indices and their applications to electronic and food industries
• Process capability analysis for bounded measurements via the \(S_{p m k}\) index

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