Bootstrap confidence intervals of generalized process capability index C_pyk using different methods of estimation
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Cites work
- scientific article; zbMATH DE number 3839126 (Why is no real title available?)
- scientific article; zbMATH DE number 3868406 (Why is no real title available?)
- scientific article; zbMATH DE number 3530858 (Why is no real title available?)
- Bootstrap confidence interval estimates of cpk: an introduction
- Bootstrap confidence intervals of \(C_{Npk}\) for inverse Rayleigh and log-logistic distributions
- Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) for Lindley and power Lindley distributions
- Capability indices for Birnbaum-Saunders processes applied to electronic and food industries
- Discriminating among Weibull, log-normal, and log-logistic distributions
- Kurtosis of the logistic-exponential survival distribution
- The efficacy of process capability indices using median absolute deviation and their bootstrap confidence intervals
- The logistic–exponential survival distribution
Cited in
(13)- Classical estimation of the index \(\mathcal{S}_{\text{pmk}}\) and its confidence intervals for power Lindley distributed quality characteristics
- Inference on the lifetime performance index of gamma distribution: point and interval estimation
- Bootstrap confidence intervals of process capability indexSpmkusing different methods of estimation
- Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) for Lindley and power Lindley distributions
- Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation
- A sensitivity study on the bootstrap confidence interval of the capability index \(C_{pm}\)
- Bootstrap lower confidence limits of superstructure process capability indices for Esscher-transformed Laplace distribution
- Classical and Bayesian estimation of the indexCpmkand its confidence intervals for normally distributed quality characteristic
- Bootstrap confidence intervals of \(C_{Npk}\) for inverse Rayleigh and log-logistic distributions
- Process capability indices in normal distribution with the presence of outliers
- Parametric inference of the process capability index for exponentiated exponential distribution
- On the bootstrap confidence intervals of the capability index \(C_{pk}\) for multiple process streams
- A sensitivity study on the bootstrap confidence interval of the capability indexCpk
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