Bootstrap confidence intervals of generalized process capability index C_pyk using different methods of estimation

DOI10.1080/02664763.2019.1572721MaRDI QIDQ5036632zbMATH OpenOpenAlexFDO

Authors Sanku Dey, Mahendra Saha

Publication date 23 February 2022

Published in Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/02664763.2019.1572721

zbMATH Keywords

maximum likelihood estimatorbootstrap confidence intervalspercentile estimatormaximum product spacing estimatorCramèr-von-Mises estimatorgeneralized process capability index

Mathematics Subject Classification ID

Applications of statistics (62Pxx)

Recommendations

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Cites work

• scientific article; zbMATH DE number 3839126 (Why is no real title available?)
• scientific article; zbMATH DE number 3868406 (Why is no real title available?)
• scientific article; zbMATH DE number 3530858 (Why is no real title available?)
• Bootstrap confidence interval estimates of c_pk: an introduction
• Bootstrap confidence intervals of \(C_{Npk}\) for inverse Rayleigh and log-logistic distributions
• Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) for Lindley and power Lindley distributions
• Capability indices for Birnbaum-Saunders processes applied to electronic and food industries
• Discriminating among Weibull, log-normal, and log-logistic distributions
• Kurtosis of the logistic-exponential survival distribution
• The efficacy of process capability indices using median absolute deviation and their bootstrap confidence intervals
• The logistic–exponential survival distribution

Cited in

(20)

• Classical estimation of the index \(\mathcal{S}_{\text{pmk}}\) and its confidence intervals for power Lindley distributed quality characteristics
• Inference on the lifetime performance index of gamma distribution: point and interval estimation
• Bootstrap confidence intervals of process capability indexS_pmkusing different methods of estimation
• Comparison of two processes based on quantile-based process capability indices by using fiducial generalized confidence interval
• Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) for Lindley and power Lindley distributions
• Classical and Bayesian estimation of the reliability characteristics for logistic-exponential distribution
• Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation
• A sensitivity study on the bootstrap confidence interval of the capability index \(C_{pm}\)
• Bootstrap lower confidence limits of superstructure process capability indices for Esscher-transformed Laplace distribution
• Estimation of a process capability index for inverse gaussian distribution
• Classical and Bayesian estimation of the indexC_pmkand its confidence intervals for normally distributed quality characteristic
• Bootstrap confidence intervals of \(C_{Npk}\) for inverse Rayleigh and log-logistic distributions
• Process capability indices in normal distribution with the presence of outliers
• Classical and Bayesian estimation of PCI \(\mathcal{C}_{\mathrm{pc}}\) using power generalized Weibull distribution
• Parametric inference of the process capability index for exponentiated exponential distribution
• On the bootstrap confidence intervals of the capability index \(C_{pk}\) for multiple process streams
• A sensitivity study on the bootstrap confidence interval of the capability indexC_pk
• Assesing the generalized process capability index \(C_{pyk}\) for Lomax distribution using different estimation methods and bootstrap confidence interval
• Estimation of a new asymmetry based process capability index C_c for gamma distribution
• A comparative study of six process capability indices and their applications to electronic and food industries

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Uses Software

• R

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