Bootstrap confidence intervals of generalized process capability indexCpykusing different methods of estimation

DOI10.1080/02664763.2019.1572721OpenAlexW2914116596MaRDI QIDQ5036632FDOQ5036632

Sanku Dey, Mahendra Saha

Publication date: 23 February 2022

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664763.2019.1572721

zbMATH Keywords

maximum likelihood estimatorbootstrap confidence intervalspercentile estimatormaximum product spacing estimatorCramèr-von-Mises estimatorgeneralized process capability index

Mathematics Subject Classification ID

Applications of statistics (62Pxx)

Cites Work

• The logistic–exponential survival distribution
• Title not available (Why is that?)
• Title not available (Why is that?)
• Capability indices for Birnbaum–Saunders processes applied to electronic and food industries
• Title not available (Why is that?)
• Bootstrap confidence interval estimates of c_pk: an introduction
• The efficacy of process capability indices using median absolute deviation and their bootstrap confidence intervals
• Bootstrap confidence intervals of C_Npkfor inverse Rayleigh and log-logistic distributions
• Kurtosis of the logistic-exponential survival distribution
• Discriminating among Weibull, log-normal, and log-logistic distributions
• Bootstrap confidence intervals of generalized process capability indexC_pykfor Lindley and power Lindley distributions

Cited In (7)

• Inference on the lifetime performance index of gamma distribution: point and interval estimation
• Bootstrap confidence intervals of process capability indexS_pmkusing different methods of estimation
• Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation
• Classical and Bayesian estimation of the indexC_pmkand its confidence intervals for normally distributed quality characteristic
• Process capability indices in normal distribution with the presence of outliers
• Parametric inference of the process capability index for exponentiated exponential distribution
• Classical estimation of the index \(\mathcal{S}_{\text{pmk}}\) and its confidence intervals for power Lindley distributed quality characteristics

Uses Software

• R

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