Bootstrap confidence intervals of generalized process capability index C_pyk for Lindley and power Lindley distributions
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Cites work
- scientific article; zbMATH DE number 3140082 (Why is no real title available?)
- scientific article; zbMATH DE number 3782216 (Why is no real title available?)
- scientific article; zbMATH DE number 1461443 (Why is no real title available?)
- scientific article; zbMATH DE number 1862734 (Why is no real title available?)
- scientific article; zbMATH DE number 1917645 (Why is no real title available?)
- scientific article; zbMATH DE number 788281 (Why is no real title available?)
- A process capability index for discrete processes
- A robust process capability index
- A two-parameter weighted Lindley distribution and its applications to survival data
- An extended Lindley distribution
- Bootstrap confidence interval estimates of cpk: an introduction
- Bootstrap confidence intervals of \(C_{Npk}\) for inverse Rayleigh and log-logistic distributions
- Delicate relations among the basic process capability indices cp, CpkAND Cpm, AND THEIR MODIFICATIONS
- Lindley distribution and its application
- Power Lindley distribution and associated inference
Cited in
(17)- On the bootstrap confidence intervals of the capability index \(C_{pk}\) for multiple process streams
- Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation
- A new control chart using GINI CPK
- Inference on the lifetime performance index of gamma distribution: point and interval estimation
- Classical and Bayesian estimation of the indexCpmkand its confidence intervals for normally distributed quality characteristic
- A sensitivity study on the bootstrap confidence interval of the capability indexCpk
- Bootstrap confidence intervals of \(C_{Npk}\) for inverse Rayleigh and log-logistic distributions
- Parametric inference of the process capability index for exponentiated exponential distribution
- Bootstrap confidence intervals of process capability indexSpmkusing different methods of estimation
- Bootstrap confidence limits for wright'C5
- Bootstrap lower confidence limits of superstructure process capability indices for Esscher-transformed Laplace distribution
- Evaluation of bootstrap confidence intervals using a new non-normal process capability index
- Estimation based on hybrid censored data from the power Lindley distribution
- Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) using different methods of estimation
- Improved bootstrap confidence intervals for the process capability index \(C_{pk}\)
- Classical estimation of the index \(\mathcal{S}_{\text{pmk}}\) and its confidence intervals for power Lindley distributed quality characteristics
- Estimation of the generalized process capability indexCpykbased on bias-corrected maximum-likelihood estimators for the generalized inverse Lindley distribution and bootstrap confidence intervals
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