Classical and objective Bayesian approaches to estimating the process capability index C_pc for the Dhillon process distribution

DOI10.1007/S40819-026-02099-6MaRDI QIDQ7288779zbMATH OpenFDO

Authors Sanku Dey, Abhimanyu Singh Yadav

Publication date 1 July 2026

Published in International Journal of Applied and Computational Mathematics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/S40819-026-02099-6

Mathematics Subject Classification ID

Point estimation (62F10) Bayesian inference (62F15) Multivariate analysis (62H99) Applications of statistics in engineering and industry; control charts (62P30)

Cites work

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• Bootstrap confidence intervals of process capability indexS_pmkusing different methods of estimation
• Capability indices for Birnbaum-Saunders processes applied to electronic and food industries
• Classical and objective Bayesian inference of \(C_{py}\) for first-failure progressively censored samples
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• scientific article; zbMATH DE number 1917645 (Why is no real title available?)
• Lindley distribution and its application
• Monte Carlo sampling methods using Markov chains and their applications
• On the generalized process capability under simple and mixture models
• Posterior properties of the Weibull distribution for censored data
• Sampling-Based Approaches to Calculating Marginal Densities
• Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of Images
• Weak convergence and optimal scaling of random walk Metropolis algorithms

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