Bayesian estimation of generalized process capability indices

DOI10.1155/2012/819730MaRDI QIDQ764445zbMATH OpenOpenAlexWikidataFDO

Authors Sudhansu S. Maiti, Mahendra Saha

Publication date 13 March 2012

Published in Journal of Probability and Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1155/2012/819730

Mathematics Subject Classification ID

Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30)

Review text

Summary: Process capability indices (PCIs) aim to quantify the capability of a process of quality characteristics (X) to meet some specifications that are related to a measurable characteristic of the produced items. One such quality characteristic is the life time of items. The specifications are determined through the lower specification limit (L), the upper specification limit (U), and the target value (T). \textit{S.S.Maiti} et al. [J. Qual. Technol. Quant. Msanagem. 7, No. 3, 279--300 (2010)] have proposed a generalized process capability index that is the ratio of proportion of the specification conformance to the proportion of desired conformance. Bayesian estimation of the index has been considered under a squared error loss function. Normal, exponential (nonnormal), and Poisson (discrete) processes have been taken into account. Bayes estimates of the index have been compared with the frequentist counterparts. Data sets have been analyzed.

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Cites work

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Cited in

(14)

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• Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation
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• Classical and Bayesian estimation of the indexC_pmkand its confidence intervals for normally distributed quality characteristic
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• A Bayesian-like estimator of the process capability index \(C_{pmk}\)

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