On the generalized process capability under simple and mixture models
From MaRDI portal
Publication:5128629
Recommendations
Cites work
- A Bayesian estimator of process capability index
- A Bayesian procedure for assessing process performance based on the third-generation capability index
- Applying Bayesian approach to assess process capability for asymmetric tolerances based on index
- Assessing process capability based on Bayesian approach with subsamples
- Bayesian estimation of generalized process capability indices
- Bayesian estimation of the parameter of Maxwell distribution under different loss functions
- scientific article; zbMATH DE number 5147454 (Why is no real title available?)
- scientific article; zbMATH DE number 1910761 (Why is no real title available?)
- scientific article; zbMATH DE number 3357742 (Why is no real title available?)
- scientific article; zbMATH DE number 7679492 (Why is no real title available?)
- Reliability Characteristics of the Maxwell Distribution: A Bayes Estimation Study
- Reliability estimation in Maxwell distribution with progressively type-II censored data
- Selection of suitable prior for the Bayesian mixture of a class of lifetime distributions under type-I censored datasets
Cited in
(17)- A compound exponential distribution with application to control charts
- Inference of process capability index \(C_{\text{py}}\) for 3-Burr-XII distribution based on progressive type-II censoring
- Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation
- A new generalized transmuted distribution
- Classical and Bayesian estimation of the indexCpmkand its confidence intervals for normally distributed quality characteristic
- Estimating process capability index \(c_{pk}\): classical approach versus Bayesian approach
- Process capability indices for fatigue life model
- Process capability indices in normal distribution with the presence of outliers
- Bayes estimator of process capability index Cpk with a specified prior mean
- Classical and Bayesian estimation of PCI \(\mathcal{C}_{\mathrm{pc}}\) using power generalized Weibull distribution
- Classical and objective Bayesian inference of \(C_{py}\) for first-failure progressively censored samples
- Change point detection to analyze air pollution and its economic effects: an exponentially weighted moving average perspective
- Estimation of C pm for autocorrelated data in the presence of random measurement errors
- Estimation of process capability index ℂ s based on multiple interval type I censored samples using generalized inverse Lindley distribution
- Classical and objective Bayesian approaches to estimating the process capability index \(C_{pc}\) for the Dhillon process distribution
- scientific article; zbMATH DE number 8239232 (Why is no real title available?)
- Parametric estimation of PCI C * pm under doubly type II censored sampling scheme with application to electronics industry data
This page was built for publication: On the generalized process capability under simple and mixture models
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5128629)