Bootstrap confidence intervals of C_Npk for inverse Rayleigh and log-logistic distributions
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Publication:5222379
DOI10.1080/00949655.2015.1040799OpenAlexW1490872786MaRDI QIDQ5222379FDOQ5222379
Authors: Muhammad Aslam, R. R. L. Kantam, G. Srinivasa Rao 
Publication date: 1 April 2020
Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00949655.2015.1040799
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bootstrap confidence intervallog-logistic distributionprocess capability indexmaximum likelihood estimateinverse Rayleigh distribution
Cites Work
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- On order statistics from thelog-logistic distribution and their properties
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- Confidence intervals for the process capability ratio based on robust estimators
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- Acceptance sampling based on life tests: Log-logistic model
- Acceptance Sampling Based on the Inverse Rayleigh Distribution
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- Estimation of a process capability index for inverse gaussian distribution
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- A note on the asymptotic distribution of the process capability index \(C_{pmk}\)
- An economic reliability test plan: Log-logistic distribution
- Process capability analysis chart with the application ofCpm
- Estimation of differences between process capability indices \(C_{pm}\) or \(C_{pmk}\) for two processes
- Bootstrap Confidence Intervals of the Difference between Two Process Capability Indices for Half Logistic Distribution
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Cited In (9)
- Bootstrap confidence intervals of process capability indexSpmkusing different methods of estimation
- Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation
- The exponentiated logarithmic generated family of distributions and the evaluation of the confidence intervals by percentile bootstrap
- Estimation of the generalized process capability indexCpykbased on bias-corrected maximum-likelihood estimators for the generalized inverse Lindley distribution and bootstrap confidence intervals
- Classical and Bayesian estimation of the indexCpmkand its confidence intervals for normally distributed quality characteristic
- Bootstrap confidence intervals of generalized process capability indexCpykfor Lindley and power Lindley distributions
- Bootstrap confidence intervals of generalized process capability indexCpykusing different methods of estimation
- Improved bootstrap confidence intervals for the process capability indexCpk
- Parametric inference of the process capability index for exponentiated exponential distribution
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