Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors
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Publication:2815982
Recommendations
- Process capability assessment for asymmetric tolerances with consideration of gauge measurement errors
- Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
- Using a novel approach to assess process performance in the presence of measurement errors
- A Hypothesis Testing Procedure on Assessing Process Performance for Asymmetric Tolerances
- A Bayesian procedure for assessing process performance based on expected relative loss with asymmetric tolerances
Cites work
- Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances
- Brocess capability with asymmetric tolerances
- Distribution and moments in simplified form for a general class of capability indices
- Generalized confidence intervals for process capability indices in the one-way random model
- New generalization of process capability index Cpk
- Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
- Statistical quality control. A modern introduction
- Testing process capability based onCpmin the presence of random measurement errors
- Tolerance design for products with asymmetric quality losses
- Using a novel approach to assess process performance in the presence of measurement errors
Cited in
(5)- Process capability assessment for asymmetric tolerances with consideration of gauge measurement errors
- Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
- Reliable measurement and influence of measurement errors on the balance algorithm of physical parameter (application on a rectification vacuum column)
- A product acceptance decision-making method based on process capability with considering gauge measurement errors
- Performance comparison of generalized confidence interval and modified sampling distribution approaches for assessing one-sided capability indices with gauge measurement errors
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