Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films (Q2383266): Difference between revisions
From MaRDI portal
Set OpenAlex properties. |
ReferenceBot (talk | contribs) Changed an Item |
||
Property / cites work | |||
Property / cites work: Q4377815 / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Q5683765 / rank | |||
Normal rank |
Latest revision as of 10:35, 27 June 2024
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films |
scientific article |
Statements
Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films (English)
0 references
8 October 2007
0 references
Ferroelectric
0 references
thin film
0 references
stress
0 references
grain size
0 references
permittivity
0 references