Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films
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Publication:2383266
DOI10.1016/j.physleta.2003.12.009zbMath1118.81392MaRDI QIDQ2383266
Jian Zhang, Li-Ben Li, Zhen Yin, Ming-Sheng Zhang
Publication date: 8 October 2007
Published in: Physics Letters. A (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.physleta.2003.12.009
74K35: Thin films
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