A new paradigm for rule-based scheduling in the wafer probe centre (Q3518508): Difference between revisions
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| Property / cites work: Scheduling of wafer test processes in semiconductor manufacturing / rank | |||
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| Property / cites work: An interactive scheduler for a wafer probe centre in semiconductor manufacturing / rank | |||
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| Property / cites work: Selection of dispatching rules on multiple dispatching decision points in real-time scheduling of a semiconductor wafer fabrication system / rank | |||
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| Property / cites work: The wafer probing scheduling problem (WPSP) / rank | |||
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Latest revision as of 14:20, 28 June 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A new paradigm for rule-based scheduling in the wafer probe centre |
scientific article |
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A new paradigm for rule-based scheduling in the wafer probe centre (English)
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8 August 2008
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paradigm
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scheduling
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dispatching rules
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wafer probe
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