Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (Q834421): Difference between revisions

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+Yu-Lan Liu
@@ Property / author: Yu-Lan Liu / rank @@
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+MaRDI publication profile
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@@ Property / full work available at URL @@
+https://doi.org/10.1016/j.ijsolstr.2008.08.039
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+W2054308952
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@@ Property / cites work @@
+On the Stress Field Due to Initial Strains in a Cuboid Surrounded by an Infinite Elastic Space
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+The determination of the elastic field of an ellipsoidal inclusion, and related problems
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+The elastic field outside an ellipsoidal inclusion
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+Virtual Circular Dislocation-Disclination Loop Technique in Boundary Value Problems in the Theory of Defects
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+A General Solution for Two-Dimensional Stress Distributions in Thin Films
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+Static Green's functions in multilayered half-spaces
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+Three-dimensional Green's functions in anisotropic bimaterials
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+Q3229113
@@ Property / cites work: Q3229113 / rank @@
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+Three-dimensional Green's functions for composite laminates
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+On generalized Kelvin solutions in a multilayered elastic medium
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+Q4939669
@@ Property / cites work: Q4939669 / rank @@
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