Pages that link to "Item:Q834421"

The following pages link to Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (Q834421):

Displaying 2 items.

• A general perturbation method for inhomogeneities in anisotropic and piezoelectric solids with applications to quantum-dot nanostructures (Q2428287) (← links)
• Thickness effects in polycrystalline thin films: surface constraint versus interior constraint (Q2428456) (← links)