Characterizations of locally testable linear- and affine-invariant families (Q764306): Difference between revisions

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-Ang Sheng Li
@@ Property / author: Ang Sheng Li / rank @@
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+Ang Sheng Li
@@ Property / author: Ang Sheng Li / rank @@
+Normal rank
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+MaRDI publication profile
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@@ Property / full work available at URL @@
+https://doi.org/10.1016/j.tcs.2011.09.030
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+W1998063107
@@ Property / OpenAlex ID: W1998063107 / rank @@
+Normal rank
@@ Property / cites work @@
+A combinatorial characterization of the testable graph properties
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@@ Property / cites work @@
+Approximation, Randomization, and Combinatorial Optimization.. Algorithms and Techniques
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+Probabilistic checking of proofs
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+Improved low-degree testing and its applications
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+Linearity testing in characteristic two
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+Robust PCPs of Proximity, Shorter PCPs, and Applications to Coding
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+Some 3CNF Properties Are Hard to Test
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@@ Property / cites work @@
+Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
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+Self-testing/correcting with applications to numerical problems
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+Graph limits and parameter testing
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+Property testing and its connection to learning and approximation
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+Locally testable codes and PCPs of almost-linear length
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+-transitivity is insufficient for local testability
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+Simple analysis of graph tests for linearity and PCP
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+Testing low-degree polynomials over prime fields
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+New generalizations of the Reed-Muller codes--I: Primitive codes
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+Q3549724
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+Sub-constant error low degree test of almost-linear size
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+On the Robustness of Functional Equations
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+Robust Characterizations of Polynomials with Applications to Program Testing
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@@ links / mardi / name / links / mardi / name @@
+Publication:764306