Characterizations of locally testable linear- and affine-invariant families
From MaRDI portal
Publication:764306
DOI10.1016/J.TCS.2011.09.030zbMATH Open1235.94066OpenAlexW1998063107MaRDI QIDQ764306FDOQ764306
Authors: Yicheng Pan, Angsheng Li
Publication date: 13 March 2012
Published in: Theoretical Computer Science (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.tcs.2011.09.030
Recommendations
Symbolic computation and algebraic computation (68W30) Algebraic coding theory; cryptography (number-theoretic aspects) (11T71) Combinatorial codes (94B25)
Cites Work
- Property testing and its connection to learning and approximation
- Locally testable codes and PCPs of almost-linear length
- Probabilistic checking of proofs
- Title not available (Why is that?)
- Robust PCPs of Proximity, Shorter PCPs, and Applications to Coding
- Self-testing/correcting with applications to numerical problems
- Testing low-degree polynomials over prime fields
- Linearity testing in characteristic two
- Robust Characterizations of Polynomials with Applications to Program Testing
- Some 3CNF Properties Are Hard to Test
- A combinatorial characterization of the testable graph properties
- Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
- Simple analysis of graph tests for linearity and PCP
- Graph limits and parameter testing
- Algebraic property testing: the role of invariance
- Approximation, Randomization, and Combinatorial Optimization.. Algorithms and Techniques
- New generalizations of the Reed-Muller codes--I: Primitive codes
- Improved low-degree testing and its applications
- 2-transitivity is insufficient for local testability
- Sub-constant error low degree test of almost-linear size
- On the Robustness of Functional Equations
Cited In (3)
This page was built for publication: Characterizations of locally testable linear- and affine-invariant families
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q764306)