Characterizations of locally testable linear- and affine-invariant families

DOI10.1007/978-3-642-22685-4_41MaRDI QIDQ3087972zbMATH OpenOpenAlexFDO

Authors Yicheng Pan, Angsheng Li

Publication date 17 August 2011

Published in Lecture Notes in Computer Science (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-3-642-22685-4_41

zbMATH Keywords

error correcting codeslocally testable codes(algebraic) property tests

Mathematics Subject Classification ID

Randomized algorithms (68W20)

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• Characterizations of locally testable linear- and affine-invariant families
• Sparse affine-invariant linear codes are locally testable

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