Burn-in considering yield loss and reliability gain for integrated circuits (Q421527): Difference between revisions

@@ Property / MaRDI profile type @@
+MaRDI publication profile
@@ Property / MaRDI profile type: MaRDI publication profile / rank @@
+Normal rank
@@ Property / full work available at URL @@
+https://doi.org/10.1016/j.ejor.2011.01.028
+Normal rank
@@ Property / OpenAlex ID @@
+W1965086212
@@ Property / OpenAlex ID: W1965086212 / rank @@
+Normal rank
@@ Property / cites work @@
+A Criterion for Burn-in that Balances Mean Residual Life and Residual Variance
+Normal rank
@@ Property / cites work @@
+Burn-in by environmental shocks for two ordered subpopulations
+Normal rank
@@ Property / cites work @@
+Burn-in and the performance quality measures in heterogeneous populations
+Normal rank
@@ Property / cites work @@
+Optimal burn-in decision for products with an unimodal failure rate function
+Normal rank
@@ Property / cites work @@
+A unified model incorporating yield, burn-in, and reliability
+Normal rank
@@ Property / cites work @@
+Optimal burn-in for maximizing reliability of repairable non-series systems
+Normal rank
@@ Property / cites work @@
+The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation
+Normal rank
@@ Property / cites work @@
+Optimal burn-in time to minimize the cost for general repairable products sold under warranty
+Normal rank