Burn-in considering yield loss and reliability gain for integrated circuits

DOI10.1016/j.ejor.2011.01.028zbMath1237.90066MaRDI QIDQ421527

Kyungmee O. Kim

Publication date: 14 May 2012

Published in: European Journal of Operational Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ejor.2011.01.028

zbMATH Keywords

reliability; defect growth; defect size distribution; negative binomial defect density

Mathematics Subject Classification ID

90B25: Reliability, availability, maintenance, inspection in operations research

62N05: Reliability and life testing

Related Items

Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing, Effects of manufacturing defects on the device failure rate

Cites Work

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• Optimal burn-in decision for products with an unimodal failure rate function