Burn-in considering yield loss and reliability gain for integrated circuits
From MaRDI portal
Publication:421527
DOI10.1016/j.ejor.2011.01.028zbMath1237.90066MaRDI QIDQ421527
Publication date: 14 May 2012
Published in: European Journal of Operational Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ejor.2011.01.028
90B25: Reliability, availability, maintenance, inspection in operations research
62N05: Reliability and life testing
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Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing, Effects of manufacturing defects on the device failure rate
Cites Work
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- The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation
- Optimal burn-in decision for products with an unimodal failure rate function