A unified model incorporating yield, burn-in, and reliability
From MaRDI portal
Publication:3156747
DOI10.1002/nav.20023zbMath1054.90023OpenAlexW2035508719MaRDI QIDQ3156747
Publication date: 11 January 2005
Published in: Naval Research Logistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/nav.20023
Reliability, availability, maintenance, inspection in operations research (90B25) Reliability and life testing (62N05)
Related Items
Model-based clustering for integrated circuit yield enhancement, Burn-in considering yield loss and reliability gain for integrated circuits
Cites Work