The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation

DOI10.1007/978-1-84800-113-8_6MaRDI QIDQ4928867zbMATH OpenOpenAlexFDO

Authors Xin Liu, Thomas A. Mazzuchi

Publication date 19 June 2013

Published in Springer Series in Reliability Engineering (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-1-84800-113-8_6

Mathematics Subject Classification ID

Reliability and life testing (62N05) Reliability, availability, maintenance, inspection in operations research (90B25)

Recommendations

• Bi-objective burn-in modeling and optimization
• An optimal burn-in policy based on a degradation model
• Bounds to optimal burn-in and optimal work size
• Minimizing Some Cost Functions Related to Both Burn-In and Field Use
• Optimal burn-in decision for products with an unimodal failure rate function
• Optimal burn-in with random minimal repair cost
• Optimal burn-in procedure for periodically inspected systems
• A Bayesian dynamic programming approach to optimal maintenance combined with burn-in

Cites work

• A Bayesian dynamic programming approach to optimal maintenance combined with burn-in
• Burn-in and Maintenance Policies
• Economic design of high stress first burn-in processes
• Graphical techniques for analyzing failure data with the percentile residual-life function
• Maximization of a survival probability and its application
• Minimizing Some Cost Functions Related to Both Burn-In and Field Use
• Optimal burn-in decision for products with an unimodal failure rate function
• Optimal burn-in time to minimize the cost for general repairable products sold under warranty
• Reliability Enhancement Through Optimal Burn-In
• Sequential burn-in procedures
• Warranty policies and burn-in

Cited in

(3)

• An overview on recent advances in statistical burn-in modeling for semiconductor devices
• Degradation-based burn-in with preventive maintenance
• Burn-in considering yield loss and reliability gain for integrated circuits

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