Effects of manufacturing defects on the device failure rate

DOI10.1016/j.jkss.2013.02.003zbMath1294.90021MaRDI QIDQ395910

Kyungmee O. Kim

Publication date: 7 August 2014

Published in: Journal of the Korean Statistical Society (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jkss.2013.02.003

zbMATH Keywords

reliability; defect clustering; defect growth; infant mortality failures

Mathematics Subject Classification ID

90B25: Reliability, availability, maintenance, inspection in operations research

Related Items

Evaluating the failure risk with and without failure data

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