Optimal burn-in for maximizing reliability of repairable non-series systems
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Publication:2519085
DOI10.1016/J.EJOR.2007.10.037zbMATH Open1152.90405OpenAlexW2054859502MaRDI QIDQ2519085FDOQ2519085
Publication date: 22 January 2009
Published in: European Journal of Operational Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ejor.2007.10.037
Reliability, availability, maintenance, inspection in operations research (90B25) Production models (90B30)
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Cited In (9)
- Effects of manufacturing defects on the device failure rate
- Burn-in considering yield loss and reliability gain for integrated circuits
- An information‐based burn‐in procedure for minimally repaired items from mixed population
- On testing whether burn-in is required under the long-run average cost
- Bi-objective burn-in modeling and optimization
- Burn-in Procedure Based on a Dependent Covariate Process
- Stochastic comparisons of linear degradation and failure time models with dependent failure modes
- Burn-in by environmental shocks for two ordered subpopulations
- Title not available (Why is that?)
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