scientific article; zbMATH DE number 880293

MaRDI QIDQ4877807zbMATH OpenFDO

Authors Wei-Ting Kary Chien, Way Kuo

Publication date 18 July 1996

zbMATH Keywords

highly integrated circuit systemsmean residual lifeoptimal burn-in policyreliabilityselling priceseries systemstress-strength modelwarranty plan

Mathematics Subject Classification ID

Nonparametric tolerance and confidence regions (62G15) Nonparametric inference (62G99) Reliability and life testing (62N05)

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