A general model of heterogeneous system lifetimes and conditions for system burn-in

DOI10.1002/NAV.10067zbMATH Open1043.90017OpenAlexW2017346728MaRDI QIDQ4456072FDOQ4456072

Kyungmee O. Kim, Way Kuo

Publication date: 15 March 2004

Published in: Naval Research Logistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/nav.10067

zbMATH Keywords

mixed distributionburn-indecreasing failure rate (DFR)extrinsic failure rate (EXFR)IBM modelintrinsic failure rate (INFR)

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Cites Work

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Cited In (6)

• Title not available (Why is that?)
• Burn-in and covariates
• A stochastic model for burn‐in procedures in accelerated environment
• Optimal burn-in for maximizing reliability of repairable non-series systems
• A unified model incorporating yield, burn-in, and reliability
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