A general model of heterogeneous system lifetimes and conditions for system burn-in

DOI10.1002/NAV.10067MaRDI QIDQ4456072zbMATH OpenOpenAlexFDO

Authors Kyungmee O. Kim, Way Kuo

Publication date 15 March 2004

Published in Naval Research Logistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/nav.10067

zbMATH Keywords

burn-indecreasing failure rate (DFR)extrinsic failure rate (EXFR)IBM modelintrinsic failure rate (INFR)mixed distribution

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Recommendations

• scientific article; zbMATH DE number 1222623
• Burn-in for Eliminating Weak Items in Heterogeneous Populations
• Burn-in and the performance quality measures in heterogeneous populations
• scientific article; zbMATH DE number 774874
• scientific article; zbMATH DE number 1084195

Cited in

(8)

• Optimal burn-in for maximizing reliability of repairable non-series systems
• A unified model incorporating yield, burn-in, and reliability
• scientific article; zbMATH DE number 1222623 (Why is no real title available?)
• scientific article; zbMATH DE number 1008396 (Why is no real title available?)
• scientific article; zbMATH DE number 1084195 (Why is no real title available?)
• Burn-in and covariates
• scientific article; zbMATH DE number 774874 (Why is no real title available?)
• A stochastic model for burn‐in procedures in accelerated environment

This page was built for publication: A general model of heterogeneous system lifetimes and conditions for system burn-in

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4456072)