Burn-in considering yield loss and reliability gain for integrated circuits (Q421527): Difference between revisions

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Property / Mathematics Subject Classification ID: 90B25 / rank
 
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Property / Mathematics Subject Classification ID
 
Property / Mathematics Subject Classification ID: 62N05 / rank
 
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Property / zbMATH DE Number
 
Property / zbMATH DE Number: 6035007 / rank
 
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Property / zbMATH Keywords
 
reliability
Property / zbMATH Keywords: reliability / rank
 
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Property / zbMATH Keywords
 
defect growth
Property / zbMATH Keywords: defect growth / rank
 
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Property / zbMATH Keywords
 
defect size distribution
Property / zbMATH Keywords: defect size distribution / rank
 
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Property / zbMATH Keywords
 
negative binomial defect density
Property / zbMATH Keywords: negative binomial defect density / rank
 
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Property / MaRDI profile type: MaRDI publication profile / rank
 
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Property / full work available at URL: https://doi.org/10.1016/j.ejor.2011.01.028 / rank
 
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Property / OpenAlex ID: W1965086212 / rank
 
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Property / cites work
 
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Latest revision as of 05:48, 5 July 2024

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Burn-in considering yield loss and reliability gain for integrated circuits
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    Burn-in considering yield loss and reliability gain for integrated circuits (English)
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    14 May 2012
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    reliability
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    defect growth
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    defect size distribution
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    negative binomial defect density
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