A fault detection and data reconciliation algorithm in technical processes with the help of Haar wavelets packets (Q1662600): Difference between revisions
From MaRDI portal
Set profile property. |
ReferenceBot (talk | contribs) Changed an Item |
||
(One intermediate revision by one other user not shown) | |||
Property / full work available at URL | |||
Property / full work available at URL: https://doi.org/10.3390/a10010013 / rank | |||
Normal rank | |||
Property / OpenAlex ID | |||
Property / OpenAlex ID: W2575594057 / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Entropy-based algorithms for best basis selection / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: A new information-theoretic approach to signal denoising and best basis selection / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: De-noising by soft-thresholding / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Density estimation by wavelet thresholding / rank | |||
Normal rank |
Latest revision as of 09:21, 16 July 2024
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | A fault detection and data reconciliation algorithm in technical processes with the help of Haar wavelets packets |
scientific article |
Statements
A fault detection and data reconciliation algorithm in technical processes with the help of Haar wavelets packets (English)
0 references
20 August 2018
0 references
Summary: This article is focused on the detection of errors using an approach that is signal based. The proposed algorithm considers several criteria: soft, hard and very hard recognition error. After the recognition of the error, the error is replaced. In this sense, different strategies for data reconciliation are associated with the proposed criteria error detection. Algorithms in several industrial software platforms are used for detecting errors of sensors. Computer simulations confirm the validation of the presented applications. Results with actual sensor measurements in industrial processes are presented.
0 references
fault detection
0 references
wavelets
0 references
process control
0 references
industry automation
0 references