Short single fault detection tests for logic networks under arbitrary faults of gates (Q5071224): Difference between revisions

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+W4285257033
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+Q3268318
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+Q2968777
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+Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
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+SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
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+Easily Testable Realizations ror Logic Functions
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+Single fault detection tests for circuits of functional elements
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+Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
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+Q4330611
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+Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
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+A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS
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+ON LOGIC NETWORKS ALLOWING SHORT SINGLE FAULT DETECTION TESTS UNDER ARBITRARY FAULTS OF GATES
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+Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
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