Optimized allocation of defect inspection capacity with a dynamic sampling strategy (Q337310): Difference between revisions
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| Property / DOI | |||
| Property / DOI: 10.1016/j.cor.2014.06.024 / rank | |||
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| Property / Mathematics Subject Classification ID: 90B25 / rank | |||
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| Property / Mathematics Subject Classification ID: 90B90 / rank | |||
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| Property / Mathematics Subject Classification ID: 90B30 / rank | |||
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| Property / Mathematics Subject Classification ID: 90C05 / rank | |||
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| Property / zbMATH DE Number | |||
| Property / zbMATH DE Number: 6650785 / rank | |||
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| Property / zbMATH Keywords | |||
semiconductor manufacturing | |||
| Property / zbMATH Keywords: semiconductor manufacturing / rank | |||
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linear programming | |||
| Property / zbMATH Keywords: linear programming / rank | |||
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capacity planning | |||
| Property / zbMATH Keywords: capacity planning / rank | |||
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inspections | |||
| Property / zbMATH Keywords: inspections / rank | |||
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wafers at risk | |||
| Property / zbMATH Keywords: wafers at risk / rank | |||
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| Property / MaRDI profile type: MaRDI publication profile / rank | |||
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| Property / full work available at URL: https://doi.org/10.1016/j.cor.2014.06.024 / rank | |||
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| Property / OpenAlex ID: W2060138442 / rank | |||
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| Property / cites work | |||
| Property / cites work: Planning quality inspection operations in multistage manufacturing systems with inspection errors / rank | |||
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| Property / DOI | |||
| Property / DOI: 10.1016/J.COR.2014.06.024 / rank | |||
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Latest revision as of 14:46, 9 December 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Optimized allocation of defect inspection capacity with a dynamic sampling strategy |
scientific article |
Statements
Optimized allocation of defect inspection capacity with a dynamic sampling strategy (English)
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10 November 2016
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semiconductor manufacturing
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linear programming
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capacity planning
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inspections
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wafers at risk
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