Optimized allocation of defect inspection capacity with a dynamic sampling strategy
DOI10.1016/J.COR.2014.06.024zbMATH Open1348.90216OpenAlexW2060138442MaRDI QIDQ337310FDOQ337310
Authors: Gloria Luz Rodriguez-Verjan, Stèphane Dauzère-Pérès, Jacques Pinaton 
Publication date: 10 November 2016
Published in: Computers \& Operations Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.cor.2014.06.024
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Cites Work
Cited In (7)
- Economic lot sampling inspection from defect counts with minimum conditional value-at-risk
- On the importance of variability when managing metrology capacity
- Efficient truncated repetitive lot inspection using Poisson defect counts and prior information
- Inspection resource assignment in a multistage manufacturing system with an inspection error model
- Setting defect charts control limits to balance cycle time and yield for a tandem production line
- Title not available (Why is that?)
- Distributing inspections in space and time -- proposed solution of a difficult problem
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