Optimized allocation of defect inspection capacity with a dynamic sampling strategy

DOI10.1016/j.cor.2014.06.024zbMath1348.90216MaRDI QIDQ337310

Stéphane Dauzère-Pérès, Gloria Luz Rodriguez-Verjan, Jacques Pinaton

Publication date: 10 November 2016

Published in: Computers \& Operations Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cor.2014.06.024

zbMATH Keywords

linear programming; semiconductor manufacturing; capacity planning; inspections; wafers at risk

Mathematics Subject Classification ID

90C05: Linear programming

90B25: Reliability, availability, maintenance, inspection in operations research

90B30: Production models

90B90: Case-oriented studies in operations research