Setting defect charts control limits to balance cycle time and yield for a tandem production line

DOI10.1016/J.COR.2014.05.011zbMATH Open1348.62270OpenAlexW2049368522MaRDI QIDQ337306FDOQ337306

Liron Yedidsion, Miri Gilenson, Michael Hassoun

Publication date: 10 November 2016

Published in: Computers \& Operations Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cor.2014.05.011

zbMATH Keywords

statistical process controlMarkov chainsqueuing theorysemiconductorscycle timeyield

Mathematics Subject Classification ID

Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Applications of statistics in engineering and industry; control charts (62P30) Graphical methods in statistics (62A09) Production models (90B30)

Cites Work

• Probability and random processes.
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• An approach to the probability distribution of cusum run length
• Finding the convex hull of a simple polygon
• Exact Results for Shewhart Control Charts with Supplementary Runs Rules
• Approximate Analysis of General Queuing Networks by Decomposition
• Some inequalities for the queue GI/G/1

Cited In (1)

• On the importance of variability when managing metrology capacity

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