Setting defect charts control limits to balance cycle time and yield for a tandem production line
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Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Applications of statistics in engineering and industry; control charts (62P30) Graphical methods in statistics (62A09) Production models (90B30)
Recommendations
- Control Limits for Multi-stage Manufacturing Processes with Binomial Yield (Single and Multiple Production Runs)
- Input Control for Serial Production Lines Consisting of Processing and Assembly Operations with Random Yields
- Influence of the Limited Service Capacity of the Inspection Station on the Control Policy of an Automatized Production System
- On the importance of variability when managing metrology capacity
- Optimized allocation of defect inspection capacity with a dynamic sampling strategy
Cites work
- scientific article; zbMATH DE number 43279 (Why is no real title available?)
- scientific article; zbMATH DE number 765034 (Why is no real title available?)
- An approach to the probability distribution of cusum run length
- Approximate Analysis of General Queuing Networks by Decomposition
- Exact Results for Shewhart Control Charts with Supplementary Runs Rules
- Finding the convex hull of a simple polygon
- Probability and random processes.
- Some inequalities for the queue GI/G/1
- Stochastic models of manufacturing systems.
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