Electromigration failure of metal lines (Q2432249): Difference between revisions
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| Property / DOI | |||
| Property / DOI: 10.1007/s10704-006-0059-6 / rank | |||
| Property / author | |||
| Property / author: Masumi Saka / rank | |||
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| Property / author: Masumi Saka / rank | |||
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| Property / MaRDI profile type: MaRDI publication profile / rank | |||
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| Property / full work available at URL: https://doi.org/10.1007/s10704-006-0059-6 / rank | |||
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| Property / OpenAlex ID: W4253012649 / rank | |||
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| Property / DOI: 10.1007/S10704-006-0059-6 / rank | |||
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Latest revision as of 14:38, 18 December 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Electromigration failure of metal lines |
scientific article |
Statements
Electromigration failure of metal lines (English)
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25 October 2006
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Electromigration
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failure
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integrated circuit
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threshold current density
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