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Property / author: Markos V. Koutras / rank
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Property / full work available at URL: https://doi.org/10.1016/j.ejor.2013.08.017 / rank
 
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Property / OpenAlex ID: W2107669265 / rank
 
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Latest revision as of 05:15, 12 July 2024

scientific article
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A compound control chart for monitoring and controlling high quality processes
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    A compound control chart for monitoring and controlling high quality processes (English)
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    24 June 2016
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    quality control
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    applied probability
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    high quality processes
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    run length distribution
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    Markov chain impedance
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    conforming run length
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