A compound control chart for monitoring and controlling high quality processes

DOI10.1016/j.ejor.2013.08.017zbMath1341.62321OpenAlexW2107669265MaRDI QIDQ296996

Markos V. Koutras, Sotiris Bersimis, Petros E. Maravelakis

Publication date: 24 June 2016

Published in: European Journal of Operational Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ejor.2013.08.017

zbMATH Keywords

quality controlapplied probabilityrun length distributionconforming run lengthhigh quality processesMarkov chain impedance

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25) Reliability and life testing (62N05) Graphical methods in statistics (62A09)

Related Items (12)

Monitoring a bi-attribute high-quality process using a mixture probability distribution ⋮ Start-up demonstration tests with sparse connection ⋮ On limiting theorems for conditional causation probabilities of multiple-run-rules ⋮ Kumaraswamy control chart for monitoring double bounded environmental data ⋮ A new economic scheme for CCC charts with run rules based on average number of inspected items ⋮ Continuous single attribute control chart for Markov-dependent processes ⋮ Generalizations of runs and patterns distributions for sequences of binary trials ⋮ Run-sum control charts for monitoring the coefficient of variation ⋮ Optimizing joint location-scale monitoring -- an adaptive distribution-free approach with minimal loss of information ⋮ Determining baseline profile by diffusion maps ⋮ The effect of measurement errors on the performance of the exponentially weighted moving average control charts for the ratio of two normally distributed variables ⋮ A new variable sample size control chart using MDS sampling

Cites Work

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