scientific article; zbMATH DE number 2154348

From MaRDI portal

zbMath1059.62125MaRDI QIDQ4664883

Douglas C. Montgomery

Publication date: 8 April 2005


Title: zbMATH Open Web Interface contents unavailable due to conflicting licenses.



Related Items

A HYPOTHESIS TESTING PROCEDURE OF ASSESSMENT FOR THE LIFETIME PERFORMANCE INDEX UNDER A GENERAL CLASS OF INVERSE EXPONENTIATED DISTRIBUTIONS WITH PROGRESSIVE TYPE I INTERVAL CENSORING, Binomial AR(1) processes: moments, cumulants, and estimation, Variable repetitive group sampling plans with process loss consideration, ARL-unbiased control charts with alarm and warning lines for monitoring Weibull percentiles using the first-order statistic, A note on the asymptotic distribution of the process capability indexCpmk, Risk-adjusted control charts based on LR-fuzzy data, Excel Templates: A Helpful Tool for Teaching Statistics, Epicasting: an ensemble wavelet neural network for forecasting epidemics, Information-based optimal subdata selection for non-linear models, New approaches to parameter estimation with statistical censoring by means of the CEV algorithm: Characterization of its properties for high-performance normal processes, Multivariate supplier selection for asymmetric specification region: using price and quality, Genetic algorithm with a Bayesian approach for multiple change-point detection in time series of counting exceedances for specific thresholds, Seasonal time-series imputation of gap missing algorithm (STIGMA), A criterion for environmental assessment using Birnbaum–Saunders attribute control charts, Unnamed Item, SPC Study of a Brewing Process, A new generation of process capability indices, Identifying the time of step change in the mean of autocorrelated processes, Investigation of the diesel consumption for trucks at an overburden stripping area by SPC study, Support vector regression based residual control charts, QuantifyingR2bias in the presence of measurement error, Normalization of the origin-shifted exponential distribution for control chart construction, Runs rules schemes for monitoring process variability, Monitoring heterogeneous serially correlated usage behavior in subscription-based services, A Phase I nonparametric Shewhart-type control chart based on the median, Detecting mean increases in Poisson INAR(1) processes with EWMA control charts, A two-step robust estimation of the process mean using M-estimator, Robustness of the EWMA control chart for individual observations, A single-featured EWMA-Xcontrol chart for detecting shifts in process mean and standard deviation, Improved quality control charts for monitoring the process mean, using double-ranked set sampling methods, Application of ridge regression and factor analysis in design and production of alloy wheels, Multivariate control chart based on the highest possibility region, Unnamed Item, One-sided asymptotic inferences for a proportion, Analysis of reliability characteristics in the acceptance sampling tests, Real-time monitoring of carbon monoxide using value-at-risk measure and control charting, New characteristics for portfolio surveillance, A Parameter-Tuned Genetic Algorithm for Economic-Statistical Design of Variable Sampling Interval X-Bar Control Charts for Non-Normal Correlated Samples, Multivariate Control Charts Based on Hybrid Novelty Scores, Multivariate Change Point Control Chart Based on Data Depth for Phase I Analysis, A comparison study of effectiveness and robustness of robust economic designs ofT2chart using genetic algorithm, Improved Shewhart-type Runs-rules Nonparametric Sign Charts, Online Control Charts for Process Averages Based on Repeated Median Filters, The ModifiedrOut ofmControl Chart, Multivariate CUSUM chart: properties and enhancements, On the Monitoring of Autocorrelated Linear Profiles, Paraconsistent Artificial Neural Network for Structuring Statistical Process Control in Electrical Engineering, Phase II statistical process control for functional data, An improved mean deviation exponentially weighted moving average control chart to monitor process dispersion under ranked set sampling, Moving range EWMA control charts for monitoring the Weibull shape parameter, A new nonparametric monitoring of data streams for changes in location and scale via Cucconi statistic, Optimal Statistical Design of a Multivariate EWMA Chart Based on ARL and MRL, The Design and Performance of the Multivariate Synthetic-T2Control Chart, Unnamed Item, Unnamed Item, Phase-I Design Scheme for -chart Based on Posterior Distribution, Unnamed Item, A Comparison of Likelihood-Based Spatiotemporal Monitoring Methods Under Non-Homogenous Population Size, Dual Nonparametric CUSUM Control Chart Based on Ranks, Enhanced operation of wastewater treatment plant using state estimation-based fault detection strategies, A Comparison of Spatiotemporal Surveillance Methods for Nonhomogeneous Change Size, Comparison of Novelty Score-Based Multivariate Control Charts, Multivariate Control Chart Based on Multivariate Smirnov Test, A Distribution-free Multivariate Change-point Model for Statistical Process Control, Closed Sequential and Multistage Inference on Binary Responses With or Without Replacement, Pareto analysis for the lifetime performance index of products on the basis of progressively first-failure-censored batches under balanced symmetric and asymmetric loss functions, Optimal design of variable acceptance sampling plans for mixture distribution, Simultaneous monitoring of process mean vector and covariance matrix via penalized likelihood estimation, Computation of optimum reliability acceptance sampling plans in presence of hybrid censoring, On the Asymptotic Confidence Intervals of Multiple-Stream Yield Index, Variable selection of spectroscopic data through monitoring both location and dispersion of PLS loading weights, Synthetic-\(\bar X\) control charts optimized for in-control and out-of-control regions, EWMA Control Charts for Monitoring Optimal Portfolio Weights, A compound control chart for monitoring and controlling high quality processes, Evaluating the lifetime performance index based on the Bayesian estimation for the Rayleigh lifetime products with the upper record values, Distribution-free mixed GWMA-CUSUM and CUSUM-GWMA Mann–Whitney charts to monitor unknown shifts in the process location, A Double Multivariate Exponentially Weighted Moving Average (dMEWMA) Control Chart for a Process Location Monitoring, A Design of Attributes Double Sampling Plans for Three-class Products, A new generation of process capability indices based on fuzzy measurements, Joint optimization of quality and cost in brass casting using stochastic programming, Single Attribute Control Charts for a Markovian-Dependent Process, Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring, Monitoring correlated processes with binomial marginals, The evaluation of educational systems: an application study, Diagnosis Aids in Multivariate Multiple Linear Regression Profiles Monitoring, Parameter estimation for binomial \(\mathrm{AR}(1)\) models with applications in finance and industry, A nonparametric exponentially weighted moving average signed-rank chart for monitoring location, A control chart based on weighted bootstrap with strata, Addressing the effect of parameter estimation on phase II monitoring of multivariate multiple linear profiles via a new cluster-based approach, One-sided precedence monitoring schemes for unknown shift sizes using generalized 2-of-(h+1) and w-of-w improved runs-rules, Basic developments of quality characteristics monitoring, Phase II monitoring of multivariate profiles with estimated parameters and optimal phase I subgroups, Detecting a shift in variance using economically designed VSI control chart with combined attribute-variable inspection, Robust surface estimation in multi-response multistage statistical optimization problems, A method for analyzing supersaturated designs inspired by control charts, Principal component analysis-based control charts using support vector machines for multivariate non-normal distributions, Parametric bootstrap process capability index control charts for both mean and dispersion, Additive outliers in INAR(1) models, Process monitoring with multivariate \(p\)-control chart, Controlling bivariate categorical processes using scan rules, Using one EWMA chart to jointly monitor the process mean and variance, Control charts for attributes with maxima nominated samples, Side sensitive group runs \(\bar X\) chart with estimated process parameters, Chi-square control charts with runs rules, Progressively first-failure censored reliability sampling plans with cost constraint, An NP Control Chart Using Double Inspections, An improvement of the Hotelling \(T^2\) statistic in monitoring multivariate quality characteristics, Unnamed Item, Exponentially weighted moving average control charts for three-level products, A Double Moving Average Control Chart, A New Procedure to Monitor the Mean of a Quality Characteristic, Alternative Factors for Control Chart Construction, Unnamed Item, Sequential risk-efficient estimation for the ratio of two binomial proportions, MINDCUMIN charts, Sequential monitoring of minimum variance portfolio, The Effects of Sample Sizes in Phases I and II onpControl Chart Performance, A Multivariate Adaptive Exponentially Weighted Moving Average Control Chart, Two-Stage Variables Acceptance Sampling Plans Using Process Loss Functions, Using a novel approach to assess process performance in the presence of measurement errors, Process capability analysis for serially dependent processes of Poisson counts, Optimization designs of the combined Shewhart-CUSUM control charts, Statistically appraising process quality of affinity isolation experiments, Statistical computation and analyses for attribute events, Shewhart-type control charts for variation in phase I data analysis, Determining baseline profile by diffusion maps, Sequential monitoring of a Bernoulli sequence when the pre-change parameter is unknown, Monitoring \(k\)th order runs in binary processes, Computational procedure of performance assessment of lifetime index of products for the Weibull distribution with the progressive first-failure-censored sampling plan, A Sequential Rank-Based Nonparametric Adaptive EWMA Control Chart, Sequential Pattern Analysis: A Statistical Investigation of Sequence Length and Support, Unnamed Item, The effects of model parameter deviations on the variance of a linearly filtered time series, Multivariate process capability using principal component analysis in the presence of measurement errors, Nonparametric monitoring of equal predictive ability, Improved attribute acceptance sampling plans based on maxima nomination sampling, Unnamed Item, CUSUM control charts for monitoring optimal portfolio weights, Sampling plan using EWMA statistic of regression estimator, Multiple states repetitive group sampling plans with process loss consideration, Linear filter model representations for integrated process control with repeated adjustments and monitoring, Unnamed Item, Jumps in binomial AR(1) processes, Statistical process control optimization with variable sampling interval and nonlinear expected loss, Using Predictive Risk for Process Control, Nonparametric sequential change-point detection for multivariate time series based on empirical distribution functions, Fuzzy nonparametric estimation of capability index \( C _{pk}\), Generalized confidence intervals for process capability indices in the one-way random model, Determining Optimal Number of Samples for Constructing Multivariate Control Charts, CUSUM Hypothesis Tests and Alternative Response Probabilities for Finite Poisson Trials, Phase I Monitoring of Polynomial Profiles, Attribute-variable Inspection Policy for Lots Using Resampling Based on EWMA, Phase II Monitoring of Nonlinear Profiles, Variables acceptance reliability sampling plan based on degradation test, Designing \(\overline X\) charts for known autocorrelations and unknown marginal distribution, LASSO-based multivariate linear profile monitoring, Designing Variables Sampling Plans with Process Loss Consideration, Economic selection of process mean for single-vendor single-buyer supply chain, Analysis of the Hirsch index's operational properties, The RL2chart versus thenpchart for detecting upward shifts in fraction defective, Ordinal response variation of the polytomous Rasch model, EWMA Control Charts for Monitoring High Yield Processes, Semiconductor chip's quality analysis based on its high dimensional test data, Sequential change detection in the presence of unknown parameters, Flexible pair-copula estimation in D-vines using bivariate penalized splines