A direct impedance tomography algorithm for locating small inhomogeneities (Q1865741): Difference between revisions
From MaRDI portal
Changed an Item |
Normalize DOI. |
||
(2 intermediate revisions by 2 users not shown) | |||
Property / DOI | |||
Property / DOI: 10.1007/s002110200409 / rank | |||
Property / MaRDI profile type | |||
Property / MaRDI profile type: MaRDI publication profile / rank | |||
Normal rank | |||
Property / full work available at URL | |||
Property / full work available at URL: https://doi.org/10.1007/s002110200409 / rank | |||
Normal rank | |||
Property / OpenAlex ID | |||
Property / OpenAlex ID: W2136356671 / rank | |||
Normal rank | |||
Property / DOI | |||
Property / DOI: 10.1007/S002110200409 / rank | |||
Normal rank |
Latest revision as of 10:53, 16 December 2024
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | A direct impedance tomography algorithm for locating small inhomogeneities |
scientific article |
Statements
A direct impedance tomography algorithm for locating small inhomogeneities (English)
0 references
27 March 2003
0 references
The authors propose a direct algorithm for determining the positions of small conductivity inhomogeneities inside an otherwise known conductor. The algorithm makes use of asymptotic expansion of the voltage potentials. The viability of this direct approach is documented by numerical examples.
0 references
inverse problems
0 references
asymptotic analysis
0 references
reconstruction algorithm
0 references
impedance tomography algorithm
0 references
direct algorithm
0 references
conductor
0 references
asymptotic expansion
0 references
numerical examples
0 references