Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (Q834421): Difference between revisions

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Property / DOI: 10.1016/j.ijsolstr.2008.08.039 / rank
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Property / author: Yu-Lan Liu / rank
 
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Property / full work available at URL: https://doi.org/10.1016/j.ijsolstr.2008.08.039 / rank
 
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Property / OpenAlex ID: W2054308952 / rank
 
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Property / cites work
 
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Latest revision as of 04:36, 10 December 2024

scientific article
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English
Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion
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    Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (English)
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    26 August 2009
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    ellipsoidal inclusion
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    eigenstrain
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    stress field
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    thin film
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    thickness
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    half-space
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