Reliability analysis for devices subject to competing failure processes based on chance theory (Q1985115): Difference between revisions

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Property / author: Zhi-Qiang Zhang / rank
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Latest revision as of 17:06, 30 July 2024

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Reliability analysis for devices subject to competing failure processes based on chance theory
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    Reliability analysis for devices subject to competing failure processes based on chance theory (English)
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    7 April 2020
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    competing failure processes
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    shock models
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    uncertainty theory
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    uncertain variable
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    uncertain distribution
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