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Latest revision as of 22:43, 19 March 2024
scientific article
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English | New-age: A negative bias temperature instability-estimation framework for microarchitectural components |
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New-age: A negative bias temperature instability-estimation framework for microarchitectural components (English)
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1 September 2009
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microprocessor reliability
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negative bias temperature instability
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NBTI framework
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reliable systems
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